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We propose and experimentally validate an AFD (atomic flux divergence)-based MTTF (mean time to failure) model for wires with EM. We analyze traditional MTTF models and compare them to the proposed model. We use the AFD-based compensation model to quantitatively capture the reservoir effect and provide a relationship between the reservoir's volume and EM lifetime enhancement.
In this paper, the atomic flux divergence (AFD) based flow for AC and pulsed DC signal line electromigration (EM) reliability estimation is proposed. The flow is implemented as a 3-stage filter based on the average (AVG) and root-mean-square (RMS) current densities. A relationship between AVG and/or RMS current densities, maximum AFD, and EM lifetime is established and validated. To avoid the necessity...
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