Search results for: Wei Lin
Microelectronics Reliability > 2015 > 55 > 1 > 231-237
Microelectronics Reliability > 2013 > 53 > 8 > 1130-1136
Microelectronics Reliability > 2013 > 53 > 3 > 405-408
Microelectronics Reliability > 2012 > 52 > 11 > 2556-2560
Microelectronics Reliability > 2012 > 52 > 11 > 2592-2596
Microelectronics Reliability > 2012 > 52 > 6 > 969-973
Microelectronics Reliability > 2012 > 52 > 5 > 866-871
Microelectronics Reliability > 2011 > 51 > 12 > 2163-2167
Microelectronics Reliability > 2011 > 51 > 2 > 381-385
Microelectronics Reliability > 2010 > 50 > 7 > 949-953
Microelectronics Reliability > 2010 > 50 > 5 > 734-737
Microelectronics Reliability > 2009 > 49 > 3 > 235-241
Microelectronics Reliability > 2001 > 41 > 11 > 1897-1902