Search results for: Yu Lin
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 799 - 801
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 475 - 478
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 688 - 690
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 61 - 68
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 633 - 636
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 775 - 777
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 110 - 118
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 3 > 554 - 561
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 207 - 218
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 600 - 607