Search results for: Yu Lin
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 3 > 554 - 561
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 207 - 218
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 3 > 554 - 561
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 207 - 218