Search results for: Cheng Shen
2016 IEEE International Electron Devices Meeting (IEDM) > 33.6.1 - 33.6.4
Materials Science in Semiconductor Processing > 2013 > 16 > 1 > 143-148
Applied Surface Science > 2012 > 258 > 11 > 4929-4933
2016 IEEE International Electron Devices Meeting (IEDM) > 33.6.1 - 33.6.4
Materials Science in Semiconductor Processing > 2013 > 16 > 1 > 143-148
Applied Surface Science > 2012 > 258 > 11 > 4929-4933