Search results for: H. Kim
2015 IEEE International Electron Devices Meeting (IEDM) > 20.7.1 - 20.7.4
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1360 - 1364
IEEE Journal of Solid-State Circuits > 2014 > 49 > 4 > 1017 - 1026
2013 IEEE International Reliability Physics Symposium (IRPS) > 4A.5.1 - 4A.5.5
IET Control Theory & Applications > 2012 > 6 > 13 > 2149 - 2156