Search results for: H. Kim
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1360 - 1364
2013 IEEE International Reliability Physics Symposium (IRPS) > 4A.3.1 - 4A.3.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 4A.5.1 - 4A.5.5
2011 International Reliability Physics Symposium > 2B.4.1 - 2B.4.4
IEEE Journal of Solid-State Circuits > 2011 > 46 > 10 > 2374 - 2385