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Tunable circuit has emerged as a promising methodology to address the grand challenge posed by process variations. Efficient high-dimensional performance modeling of tunable analog/RF circuits is an important yet challenging task. In this paper, we propose a novel performance modeling approach for tunable circuits, referred to as Correlated Bayesian Model Fusion (C-BMF). The key idea is to encode...
Efficient high-dimensional performance modeling of nanoscale analog and mixed signal (AMS) circuits is extremely challenging. In this paper, we propose a novel structure-aware modeling (SAM) technique. The key idea of SAM is to accurately solve the model coefficients by applying an efficient statistical algorithm to exploit the underlying structure of AMS circuits. As a result, SAM dramatically reduces...
This paper proposes a new approach to analyze crosstalk of coupled interconnects in the presence of process variations. The suggested method translates correlated process variations into orthogonal random variables by principle component analysis (PCA). combined with polynomial chaos expression (PCE), the technique utilizes Stochastic Collocation Method (SCM) to analyze the system response of coupled...
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