Search results for: P. Girard
Journal of Electronic Testing > 2012 > 28 > 2 > 215-228
2010 15th IEEE European Test Symposium > 132 - 137
IEEE Transactions on Computers > 2010 > 59 > 3 > 289 - 300
Journal of Electronic Testing > 2009 > 25 > 2-3 > 127-144