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Manufacturing processes in the nanoscale era are less and less reliable thus leading to lower and lower yields. To address this problem during SoC development, memory cores are built with hardware redundancies. On the other hand, logic cores embedded in SoC usually do not have these main capabilities. Therefore, manufacturing defects affecting these cores decrease the yield of the entire SoC. Consequently,...
This paper presents an extended version of a diagnosis method proposed so far, that considers only the logic information provided by the tester to achieve diagnosis results. The main advantage of the proposed method is its capability to handle several fault models at the same time, e.g., static, dynamic, at transistor level, thus setting up a unified framework for logic diagnosis. Experiments on ITC'99...
Scan architectures, though widely used in modern designs for testing purpose, are expensive in test data volume and power consumption. To solve these problems, the authors propose in this paper to modify an existing test data compression technique so that it can simultaneously address test data volume and power consumption reduction for scan testing of embedded intellectual property (IP) cores. Compared...
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