The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper presents an extended version of a diagnosis method proposed so far, that considers only the logic information provided by the tester to achieve diagnosis results. The main advantage of the proposed method is its capability to handle several fault models at the same time, e.g., static, dynamic, at transistor level, thus setting up a unified framework for logic diagnosis. Experiments on ITC'99...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.