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Dielectric properties of Na1/2Bi1/2Cu3Ti4O12 ceramics were evaluated over the temperature range 300‐720 K. Two relaxor‐like dielectric anomalies were found. The low‐temperature anomaly was confirmed to be an oxygen‐vacancy‐related relaxation process. It is a pseudo‐relaxor behavior caused by a bulk relaxation and a Maxwell‐Wagner relaxation. The high‐temperature one was evidenced to be an electric...
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