The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Opportunistic routing is applied to wireless multi-hop network. It makes full use of the characteristic of wireless network, decreasing the retransmission of data packet, increasing the throughput. At present, opportunistic routing is based on the assumption that the node and link are completely reliable. This paper proposes a reliable opportunistic routing, which evaluates reliability of node using...
This work presents a low-cost wireless system design that serves as an interface to support the SoC with contactless testability feature. The communication hierarchy includes PHY, MAC, data exchange, and test wrapper functions. The wireless does not require external antennae and crystal reference, and therefore minimize the setup cost. The embedded all-digital timing generation achieves robust performance...
Currently embedded remote monitoring technology step into a rapidly developing period. With the advancement of related technology, low cost remote monitoring system which is web-based, powerful and reliable at the same time will become the mainstream. Under this background, this paper presents a lightweight embedded remote monitoring system. The owerall system established a LAN using zensys's Z-WAVE...
Small delay defects, when escaping from traditional delay testing, could cause a device to malfunction in the field. To address this issue, we propose an adaptive-frequency test method, abbreviated as AF-test. In this method, versatile test clocks can be generated on the chip by embedding an All-Digital Phase-Locked Loop (ADPLL) into the circuit under test (CUT). Instead of measuring the exact propagation...
To reduce test cost for SOC products, it is important to reduce the cost of testers. When using low-cost testers which have a limited test bandwidth to perform testing, built-in- self-test (BIST) is necessary to reduce the data volume to be transmitted between the tester and the device-under-test (DUT). We enhance the SOC test integration tool, STEAC, so that it can support SOCs containing BISTed...
In this paper, we introduce a new test paradigm called indirect-access scan test, demonstrated over the HOY test platform [12]. Unlike the traditional ATE-based testing, the test data in this paradigm are sent to the chip under test via packets over a single indirect channel. Although there is extra test time overhead for establishing the store-and-forward communication, it offers almost unlimited...
With continuing trends to embed more on-chip test circuits, increasing complexity requires more efforts on design and validation. In this paper, we use a wireless test system as an example, to demonstrate the efficiency of system-level techniques in assisting circuit specification exploration, with the goal of area and test-cost reduction. In our experiments, 30% to 50% total costs are saved compared...
Summary form only given. Test cost has become a significant portion of the cost structure in advanced semiconductor memory products. To address this issue at both the wafer and packaged-chip levels, we propose HOY - a novel wireless test system with enhanced embedded test features. In this talk we will briefly outline Project HOY and the test systems and applications it defines, with focus on memory...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.