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With rapid development of lighting emitting diode (LED) market, more people are focusing on reliability testing method of LED luminaries system. Based on the previous exploration, to assess the whole system reliability with a fast way, authors propose to divide the system into several subsystems, and then carry out step stress accelerated testing (SSAT) to get failure mechanism and reliability distribution...
We report on the effect of front-side Ag metallization on the underlying n+-p junction of multicrystalline Si solar cells. The junction quality beneath the contacts was investigated by characterizing the uniformities of the electrostatic potential and doping concentration across the junction, using scanning Kelvin probe force microscopy and scanning capacitance microscopy. We investigated cells with...
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