Search results for: H. Yu
Materials Letters > 2017 > 209 > C > 476-478
2015 IEEE International Electron Devices Meeting (IEDM) > 21.7.1 - 21.7.4
Polymer Degradation and Stability > 2004 > 83 > 3 > 395-398
Materials Letters > 2017 > 209 > C > 476-478
2015 IEEE International Electron Devices Meeting (IEDM) > 21.7.1 - 21.7.4
Polymer Degradation and Stability > 2004 > 83 > 3 > 395-398