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The residual CuxSe phase results in shunt leakage paths in Cu-rich Cu(In,Ga)Se2 (CIGS) which can cause serious degradation in the conversion efficiency. The conductive atom force microscopy(C-AFM) was employed to obtain a direct evidence of shunt leakage paths in the Cu-rich CIGS thin film. The results reveal that CuxSe phase exists not only near the surface but also inside the Cu-rich CIGS thin films...
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