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The capabilities of hard mask (HM) and lithographic are strongly depended on the step coverage (S/C) of HM. Using C2H2 base amorphous carbon (a-C) as HM gets better sidewall S/C than using C3H6 one due to superior sticking coefficient (higher C/H ratio). As to performance of against PR rework, overlay mark without damage is displayed by adopting C2H2 base a-C even five times PR rework. In our case,...
Particle filtering framework is widely used on tracking applications. In surveillance systems, it often combines with color information to achieve visual object tracking. However, the resource usage of this framework, including memory bandwidth and operation cycles, is very intensive to make a low cost real time object tracking unattainable. In this paper, an efficient architecture of color based...
Embedded memory plays an important role in modern system-on-chip designs. However, the reliability issue of embedded memories becomes more and more critical with the shrinking of transistor feature size. This paper proposes a programmable online/off-line built-in self-test (BIST) scheme for random access memories (RAMs) with error correction code (ECC). The BIST scheme can be used for performing production...
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