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The advent of hard X‐ray free‐electron lasers enables nanoscopic X‐ray imaging with sub‐picosecond temporal resolution. X‐ray grating interferometry offers a phase‐sensitive full‐field imaging technique where the phase retrieval can be carried out from a single exposure alone. Thus, the method is attractive for imaging applications at X‐ray free‐electron lasers where intrinsic pulse‐to‐pulse fluctuations...
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