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In this study, the detailed microstructure of sulfur-doped Bi2Te3 and the distribution of sulfur dopants were investigated using X-ray diffraction (XRD) and transmission electron microscopy (TEM). XRD result indicates that the interplanar distances of Bi2Te3 are shortened after introducing sulfur dopants. HRTEM reveals that the unit cell lengths along [001, 100] are decreased as a result of the substitution...
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