The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper addresses the task of automating the visual inspection of contamination on the surface of integrated circuits (IC) wafers arising from the dicing process. Using a set of multi-spectral optical filters and a charged coupled device (CCD) video camera, several images are acquired from each IC wafer under different illumination conditions, from which feature space data are then generated. Three...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.