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Timing-related failures in high-performance integrated circuits are being increasingly dominated by small-delay defects (SDDs). Such delay faults are caused by process variations, crosstalk, power-supply noise, and defects such as resistive shorts and opens. Recently, the concept of output deviations has been presented as a surrogate long-path coverage metric for SDDs. However, this approach is focused...
We propose and evaluate the use of lazy error detection for a superscalar, out-of-order microprocessor s functional units. The key insight is that error detection is off the critical path, because an instruction s results are speculative for at least a cycle after being computed. The time between computing and committing the results can be used to lazily detect errors, and laziness allows us to use...
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