Search results for: Yichuang Sun
IEEE Design & Test > 2016 > 33 > 3 > 77 - 90
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 3 > 586 - 595
Analog Integrated Circuits and Signal Processing > 2009 > 61 > 1 > 87-92
IEEE Design & Test > 2016 > 33 > 3 > 77 - 90
IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 3 > 586 - 595
Analog Integrated Circuits and Signal Processing > 2009 > 61 > 1 > 87-92