Search results for: Y. H. Lee
2016 IEEE International Electron Devices Meeting (IEDM) > 31.7.1 - 31.7.4
2015 IEEE International Reliability Physics Symposium > 3A.4.1 - 3A.4.6
IEEE Transactions on Magnetics > 2007 > 43 > 2-2 > 911 - 913
2016 IEEE International Electron Devices Meeting (IEDM) > 31.7.1 - 31.7.4
2015 IEEE International Reliability Physics Symposium > 3A.4.1 - 3A.4.6
IEEE Transactions on Magnetics > 2007 > 43 > 2-2 > 911 - 913