Search results for: Ran Liu
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 90 - 100
IEEE Electron Device Letters > 2007 > 28 > 7 > 565 - 568
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 1 > 90 - 100
IEEE Electron Device Letters > 2007 > 28 > 7 > 565 - 568