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An atomic Monte-Carlo simulator of Conductive Bridge Random Access Memory (CBRAM) is developed to investigate the microscopic properties of filament growth and dissolution during Forming/SET and RESET processes. The cluster growth during nucleation correlated with electrochemical reactions and cations transportation are included. The impacts of the critical material parameters on the geometry of conductive...
Molecular dynamics simulations were performed to elucidate the interactions between screw dislocations and self-interstitial atom (SIA) defects in body-centered cubic Fe, using an embedded atom method potential fitted to ab initio forces. Two interaction mechanisms were identified: the junction mechanism, in which the original 1/2〈111〉 SIA loop was transformed into a 〈100〉 loop after the interaction,...
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