Search results for: P. V. Seredin
Semiconductors > 2019 > 53 > 11 > 1550-1557
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2019 > 13 > 4 > 756-765
Semiconductors > 2019 > 53 > 8 > 1120-1130
Semiconductors > 2019 > 53 > 7 > 993-999
Semiconductors > 2019 > 53 > 1 > 65-71
Semiconductors > 2018 > 52 > 13 > 1653-1661
Optics and Spectroscopy > 2018 > 125 > 5 > 803-809
Semiconductors > 2018 > 52 > 9 > 1163-1170
Semiconductors > 2018 > 52 > 8 > 1012-1021
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2018 > 12 > 3 > 442-451
Semiconductors > 2018 > 52 > 1 > 112-117
Optics and Spectroscopy > 2018 > 124 > 2 > 187-192
Bulletin of the Russian Academy of Sciences: Physics > 2017 > 81 > 9 > 1119-1126
Semiconductors > 2017 > 51 > 9 > 1111-1118
Semiconductors > 2017 > 51 > 8 > 1087-1092
Inorganic Materials > 2017 > 53 > 5 > 477-483
Physics of the Solid State > 2017 > 59 > 4 > 791-800
Biophysics > 2016 > 61 > 6 > 871-876
Semiconductors > 2017 > 51 > 2 > 184-188
Semiconductors > 2017 > 51 > 1 > 122-130