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Epitaxial BaTiO3 (BTO) films were deposited on (La0.5Sr0.5)CoO3 buffered (001)-oriented YAlO3, LaAlO3, (La0.5Sr0.5)(Al0.5Ta0.5)O3, and SrTiO3 single-crystal substrates using radio-frequency magnetron sputtering. XRD analyses identified that the actual in-plane misfit strains are an order of magnitude less than the unrelaxed lattice misfit (the relaxation of the film/substrate internal stresses). The...
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