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To provide a new avenue for improving yield for nano-scale fabrication processes, we introduce a new notion: performance degrading faults (pdef). A fault is said to be a pdef if it cannot cause a functional error at system outputs but may result in system performance degradation. In a processor, a fault is a pdef if it causes no error in the execution of user programs but may reduce performance, e...
Data intensive applications require massive data transfers between storage and processing units. VLSI scaling has increased the sizes of dynamic memories as well as speeds and capabilities of processing units to a point where, for many such applications, storage and computational processing capabilities are no longer the main limiting factors. Despite this fact, most current architectures fail to...
This paper reviews key features of the 10 GBASE-T standard for full duplex 10 Gb/s transmission over structured copper cabling in the LAN environment. Tradeoffs in implementing 10 GBASE-T transceivers are discussed. We then present the first implementation of 10 GBASE-T in digital CMOS technology (0.13 mum). This transceiver also supports lower speeds for backward compatibility with legacy Ethernet...
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