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In article number 1801564, Jin Zou, Chengzhong Yu, and co‐workers showcase the exceptional characterization capability of electron tomography (ET) toward intricate hollow nanostructures. As a unique and powerful toolkit, ET reveals both structural and compositional information that cannot be obtained from conventional electron microscopy analysis, reflecting genuine architectures of 3D nano‐objects...
Innovations in nanofabrication have expedited advances in hollow‐structured nanomaterials with increasing complexity, which, at the same time, set challenges for the precise determination of their intriguing and complicated 3D configurations. Conventional transmission electron microscopy (TEM) analysis typically yields 2D projections of 3D objects, which in some cases is insufficient to reflect the...
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