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In this paper, a low-cost and process-insensitive random jitter testing algorithm is proposed for on-chip design-for-test applications. The algorithm incurs low hardware cost as it utilizes a low tap-count delay line to extract the RMS jitter information. Furthermore, the proposed algorithm can tolerate reasonable delay line deviations. Our simulation results show that using an eight-tap delay line,...
The jet-cooled rotationally resolved spectra of the pre-dissociation band g0 of the 1 B 2 ( 1+u ) state of CS 2 at 210 nm, which were initiated from highly vibrationally excited levels of the ground electronic state X 1+g , were recorded using the technique of stimulated emission pumping to prepare the initial levels. The band...
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