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To improve prediction accuracy of die yield, a novel fuzzy neural networks (FNN) based yield prediction approach is proposed. The yield prediction model is built, in which the impact factors of yield, including physical parameters, electrical test parameters and wafer defect parameters are considered simultaneously and are taken as independent variables. A back-propagation algorithm is used to train...
This paper aims at minimizing the makespan for a single batch processing machine with non-identical job sizes (NSBM) using neural nets (NN) approach. NN approach was proved effective to solve combinatorial optimization problems but no application to NSBM problems hitherto. This research provides new methods to code the NN with the introduction of Master Weight Matrix (MWM). Computational experiments...
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