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Scan-based design for test (DFT) is a powerful testing scheme, but it can be used to retrieve the secrets stored in a crypto chip, thus compromising its security. On one hand, sacrificing the security for testability by using a traditional scan-based DFT restricts its use in privacy sensitive applications. On the other hand, sacrificing the testability for security by abandoning the scan-based DFT...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.