Search results for: A. Bensoussan
Microelectronics Reliability > 2017 > 76-77 > C > 159-163
Stochastic Processes and their Applications > 2017 > 127 > 7 > 2093-2137
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2242 - 2249
Microelectronics Reliability > 2017 > 76-77 > C > 159-163
Stochastic Processes and their Applications > 2017 > 127 > 7 > 2093-2137
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2242 - 2249