Search results for: R. K. Yafarov
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2019 > 13 > 4 > 752-755
Technical Physics > 2019 > 64 > 8 > 1210-1220
Technical Physics > 2019 > 64 > 6 > 897-901
Technical Physics Letters > 2019 > 45 > 5 > 423-425
Journal of Communications Technology and Electronics > 2019 > 64 > 3 > 265-270
Russian Microelectronics > 2019 > 48 > 2 > 127-130
Semiconductors > 2019 > 53 > 1 > 14-21
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2018 > 12 > 5 > 1013-1017
Semiconductors > 2018 > 52 > 9 > 1104-1109
Technical Physics Letters > 2018 > 44 > 7 > 585-587
Russian Microelectronics > 2018 > 47 > 4 > 251-258
Technical Physics > 2018 > 63 > 2 > 274-284
Technical Physics > 2018 > 63 > 1 > 126-132
Technical Physics Letters > 2017 > 43 > 12 > 1132-1135
Semiconductors > 2018 > 52 > 2 > 137-142
Russian Microelectronics > 2018 > 47 > 2 > 104-111
Semiconductors > 2016 > 50 > 1 > 54-58
Technical Physics > 2017 > 62 > 10 > 1585-1591
Semiconductors > 2017 > 51 > 4 > 531-535