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Polar radio architectures are attractive due to the ability to implement them using largely digital architectures. However, testing for specs such as EVM incurs significant test time due to the large numbers of symbols that need to be transmitted. In our approach, EVM is modeled as a function of the system static non-idealities (IQ mismatch, gain, IIP3 parameters) and dynamic non-idealities (VCO phase...
In production testing of wireless systems, measurement of EVM (a critical spec that is directly related to bit error rate) incurs significant test time due to the large numbers of symbols that need to be transmitted for reasons of accuracy. In our approach, EVM is modeled as a function of the system static non-idealities (IQ mismatch, gain, IIP3 parameters) and dynamic non-idealities (system noise,...
Polar radio architectures are gaining in popularity due to the promise of an all digital implementations in future CMOS systems-on-chip (SoCs) solutions. Test cost is an important consideration for manufacturers developing these complex devices. Phase noise is an important specification in all digital polar radios as it affects the signal modulation quality. In this paper, a low cost test technique...
This paper presents a time-domain jitter expansion technique for high-speed digital bit sequence jitter testing. While jitter expansion has been applied to phase noise measurements of sinusoidal signals before, its applicability to random clock jitter testing and data-dependent jitter testing have not been explored. The latter problems have wide application and necessitate new analysis procedures...
In the recent days, ultra-wide band (UWB) has drawn significant attention as an emerging wireless standard. While the multiband (MB) orthogonal frequency division multiplexing (OFDM) PHY standards (IEEE 802.15.3a) are still being formulated, the first set of UWB devices is set to hit the consumer market by the end of 2005. For MB-OFDM UWB devices to be successful in the marketplace it is necessary...
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