Search results for: A. V. Latyshev
JETP Letters > 2019 > 110 > 5 > 354-358
Geotectonics > 2019 > 53 > 5 > 548-568
Doklady Earth Sciences > 2019 > 487 > 2 > 877-880
Journal of Communications Technology and Electronics > 2019 > 64 > 9 > 1024-1029
Journal of Communications Technology and Electronics > 2019 > 64 > 9 > 1011-1015
Opto-Electronics Review > 2019 > Vol. 27, No. 3 > 282--290
Semiconductors > 2019 > 53 > 6 > 795-799
Izvestiya, Physics of the Solid Earth > 2019 > 55 > 2 > 270-286
Semiconductors > 2019 > 53 > 4 > 434-438
Geotectonics > 2018 > 52 > 3 > 331-345
Russian Microelectronics > 2018 > 47 > 6 > 365-370
Semiconductors > 2018 > 52 > 16 > 2081-2084
Seismic Instruments > 2018 > 54 > 5 > 579-585
Computational Mathematics and Mathematical Physics > 2018 > 58 > 9 > 1510-1530
Optoelectronics, Instrumentation and Data Processing > 2018 > 54 > 2 > 168-174
Physics of the Solid State > 2018 > 60 > 4 > 700-704
Semiconductors > 2018 > 52 > 5 > 618-621
Semiconductors > 2018 > 52 > 5 > 628-631
Measurement Techniques > 2018 > 60 > 11 > 1087-1090
High Temperature > 2017 > 55 > 5 > 631-637