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A successful detection of the stealthy dopant-level circuit (trojan), proposed by Becker et al. at CHES 2013 (LNCS 8086:197–214, 2013), is reported. Contrary to an assumption made by Becker et al. dopant types in active region are visible with either scanning electron microscopy (SEM) or focused ion beam (FIB) imaging. The successful measurement is explained by a technique called the passive voltage...
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