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The application of X-ray techniques for studies of the interface structure of Co/Cu multilayers has been presented with a pre-deposited ultrathin film of Bi and Pb. The [Co(1 nm)/Cu(2 nm)] multilayers were thermally evaporated at very low deposition rates with a small amount of Bi and Pb surfactant (about 0.2 ML) introduced at each Cu layer. The structure of Co/Cu multilayers with added surfactant...
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