The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
When applying high-temperature superconductor (HTS) devices in power systems, ac loss is a significant obstacle from an economic perspective. Many studies have been performed to investigate this issue, but the ac losses for different current waveforms have rarely been reported. However, in power systems, many nonlinear devices can distort current waveforms. For example, currents of converters have...
This work presents the mechanism of Stress induced leakage current (SILC) under NBT stress. Experiment results show that there are three kinds of oxide traps generated under NBT stress: hole traps with full recoverable characteristic, hydrogen related traps with irrecoverable characteristic and a kind of positive trap which can promote the hole tunneling after neutralization. The cause of SILC is...
Metal-insulator-semiconductors structures (MIS) with a layer of silicon nanocrystals embedded within two SiO2 layers are fabricated by using plasma enhanced chemical vapor deposition. By using current-voltage (I-V) measurements with different sweep rates, we study the mechanism of electrons and holes charging/discharging characteristic of the MIS structures. Distinct current peaks duo to electrons...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.