Search results for: Zhen Xu
IEEE Access > 2017 > 5 > 14830 - 14836
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 74 - 79
2011 IEEE International Ultrasonics Symposium > 1490 - 1493
IEEE Access > 2017 > 5 > 14830 - 14836
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 74 - 79
2011 IEEE International Ultrasonics Symposium > 1490 - 1493