Search results for: D. A. Usanov
Technical Physics > 2019 > 64 > 10 > 1523-1526
Journal of Communications Technology and Electronics > 2019 > 64 > 4 > 399-408
Journal of Communications Technology and Electronics > 2019 > 64 > 4 > 409-416
Russian Microelectronics > 2018 > 47 > 7 > 532-537
Technical Physics Letters > 2018 > 44 > 12 > 1133-1135
Semiconductors > 2018 > 52 > 15 > 1931-1935
Semiconductors > 2018 > 52 > 13 > 1669-1671
Russian Journal of Nondestructive Testing > 2018 > 54 > 8 > 576-584
Technical Physics > 2018 > 63 > 7 > 1015-1018
Technical Physics Letters > 2018 > 44 > 3 > 210-212
Journal of Communications Technology and Electronics > 2018 > 63 > 1 > 58-63
Technical Physics > 2017 > 62 > 9 > 1440-1443
Technical Physics > 2017 > 62 > 6 > 899-902
Russian Journal of Nondestructive Testing > 2017 > 53 > 2 > 117-125
Technical Physics > 2017 > 62 > 2 > 243-247
Semiconductors > 2016 > 50 > 13 > 1759-1763
Technical Physics Letters > 2016 > 42 > 9 > 919-922
Journal of Communications Technology and Electronics > 2016 > 61 > 4 > 379-384
Journal of Communications Technology and Electronics > 2016 > 61 > 1 > 42-49
Technical Physics > 2016 > 61 > 2 > 221-226