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Conventional time dependent dielectric breakdown (TDDB) test for discrete device usually ties source and drain together, i.e. Vds = 0V. However, this condition is seldom seen in a switching logic circuit. To mimic the true behavior of a switching device in a circuit, an inverter-like AC TDDB 64-bit test array is constructed. Although this result in not only TDDB and BTI but also the combined effect...
Finger vein imaging using near infrared methods have high sensitivity towards illumination and often suffer from bad image sharpness and loss of information. An embedded image acquisition subsystem with adaptive illumination control based on image quality assessment is introduced in this paper in order to acquire finger vein image with good quality for high accuracy authentication. The quality of...
This study investigates the relative performances of Array, Wallace, Dadda and Reduced Area multipliers for several synthesis optimization modes. All multiplier designs were modeled in Verilog HDL and synthesized based on the TSMC 0.35-micron ASIC Design Kit standard cell library. Performance data was extracted after logic synthesis in LeonardoSpectrum for Area, Speed and Auto optimization modes....
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