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Single event upsets (SEUs) and single event transients (SETs) are major reliability concerns in deep submicron technologies. As technology feature size shrinks, digital circuits are becoming more susceptible to SEUs and SETs. A novel SEU/SET-tolerant latch called feedback redundant SEU/SET-tolerant latch (FERST) is presented, where redundant feedback lines are used to mask SEUs and delay elements...
The continuous decrease in CMOS technology feature size increases the susceptibility of such circuits to single event upsets (SEU) caused by the impact of particle strikes on system flip flops. This paper presents a novel SEU-tolerant latch where redundant feedback lines are used to mask the effects of SEUs. The power dissipation, area, reliability, and propagation delay of the presented SEU-tolerant...
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