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Equivalent circuits of Modular Multilevel Converters (MMCs) and Voltage-Source Converters (V SCs) are developed to predict that MMCs are suited for series connection for Ultra High Voltage MMC-HVDC transmission and for parallel connection as Multi-terminal MMC-HVDC. Simulations validate the predictions.
In this paper, we present a very fast and accurate technique to estimate the soft error rate of digital circuits in the presence of Multiple Event Transients (METs). In the proposed technique, called Multiple Event Probability Propagation (MEPP), a four-value logic and probability set are used to accurately propagate the effects of multiple erroneous values (transients) due to METs to the outputs...
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