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Given today's fast growing automotive semiconductor industry, this tutorial will discuss the implications of automotive test, reliability and functional safety requirements on all aspects of the SOC lifecycle: design, silicon bring-up, volume production, and particularly in-system functional safety. Today's automotive safety critical chips need multiple insystem self-test modes, such as power-on self-test...
With technologies shrinking and design complexity increasing, it becomes crucial that embedded in chip test and repair solutions keep up with the advances in order to consistently provide superior chip quality and yield optimization. The embedded test approaches developed for designs done a few years ago are not sufficient for today's designs, which are bigger, faster, hierarchical and much more sensitive...
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