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Creep properties of a polycrystalline binary near γ-TiAl intermetallic in two fully lamellar microstructural conditions are presented. Creep tests (760 o C/240 MPa) indicate that a lamellar structure with fine interface spacing and planar grain boundaries improves creep resistance. A lamellar structure with wide lamellar interface spacing and interlocked grain boundaries has less than half...
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