Search results for: V. V. Privezentsev
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2019 > 13 > 4 > 734-739
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques > 2019 > 13 > 3 > 382-386
Crystallography Reports > 2019 > 64 > 3 > 451-456
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2019 > 13 > 2 > 326-334
Semiconductors > 2019 > 53 > 3 > 313-320
Semiconductors > 2018 > 52 > 16 > 2070-2072
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2018 > 12 > 5 > 893-897
Semiconductors > 2018 > 52 > 8 > 961-968
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2018 > 12 > 2 > 213-216
Semiconductors > 2018 > 52 > 5 > 645-650
Bulletin of the Russian Academy of Sciences: Physics > 2018 > 82 > 2 > 163-169
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques > 2017 > 11 > 3 > 625-633
Thermal Engineering > 2017 > 64 > 1 > 6-14
Semiconductors > 2017 > 51 > 2 > 178-183
Bulletin of the Russian Academy of Sciences: Physics > 2016 > 80 > 12 > 1421-1426
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques > 2016 > 10 > 3 > 597-602
Atomic Energy > 2016 > 120 > 5 > 328-334
Bulletin of the Russian Academy of Sciences: Physics > 2016 > 80 > 2 > 149-155
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques > 2015 > 9 > 3 > 486-495
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques > 2015 > 9 > 4 > 804-811