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HfO2-based resistive oxide memories are studied by core-level spectromicroscopy using a laboratory-based X-ray photoelectron emission microscope (XPEEM). After forming, the top electrode is thinned to about 1 nm for the XPEEM analysis, making the buried electrode/HfO2 interface accessible whilst preserving it from contamination. The results are obtained in the true photoemission channel mode from...
Using laboratory X-ray photoelectron emission microscopy (XPEEM), we investigated the doping efficiency and thermal stability of iodine on as-grown graphene on Pt. After iodine adsorption of graphene in saturated vapor of I2, monolayer and bilayer graphene exhibited work function of 4.93eV and 4.87eV, respectively. Annealing of the doped monolayer graphene at 100°C led to desorption of hydrocarbons,...
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