The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Atom probe tomography has been combined with high resolution transmission electron microscopy (HRTEM) to confirm the existence of such clusters by atomic resolution observation. HRTEM images indicate that the solute clusters are ~3 nm in diameter and contains ~850 atoms. The clusters have diffuse boundaries, maintain the same crystal structure as the host lattice and are roughly spherical in shape...
Atom probe tomography and high resolution transmission electron microscopy have been employed to reveal clustering of Si and Ge atoms in ternary Al–Si–Ge. No such clusters were observed in binary Al–Si. The clusters were on the order of five nanometers in diameter and contained Si, Ge and Al. This confirms a previous hypothesis that postulates the existence of such clusters due to atomic mismatch...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.