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Recent analog designers do think about measurement at design time. Analog design-for-measurement is a real success, not based on test research but based on designers' incorporation of calibration methods to ensure that their circuits work within specifications. In the meantime, mixed-signal test research has not kept pace with new design architectures, and some analog designers have outpaced mixed-signal...
This paper describes the architecture and principles of operation of sigma-delta ( ΣΔ) time-to-digital converters (TDC) for high-speed I/O interface circuit test applications. In particular, we describe multi-bit ΣΔ TDC architectures; they offer good accuracy with short testing time. However, mismatches among delay cells in delay lines degrade their linearity. Here we propose two methods to improve...
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